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Latest Project for August 1st, 2011

Statistical Characterization and Simulation of VLSI Circuits Considering Process Variations

Principle Investigators Dr. Sheldon Tan (PI) Collaborators Dr. Yici Cai, Tsinghua University, China Dr. Hao Yu, NTU, Singapore Dr. Jinjun Xiong, IBM T. J. Watson Research Center, USA Dr. Chandu Visweswariah, IBM, USA Graduate Students Yue Zhao Ruijing Shen, Duo Li, Zhigang Hao, Ning Mi Funding supports National Science Foundation, “SHF: Small: Variational and Bound...