Prof. Tan delivered tutorial in ICCAD'14 for VLSI reliability model and optimization
Dr. Sheldon Tan and Dr. Valery Sukharev of Mentor Graphics and Dr. Mark Chew of Mentor Graphics delivered a tutorial in the IEEE/ACM International Conference on Computer-Aided Design (ICCAD'14) In San Jose, CA.
Dr. Tan presented tutorial talk titled "Lifetime Optimization for Real-Time Embedded Systems Considering Electromigration Effects".
10/15/2014 Dr. Tan gave an invited talk in the 13th Stress workshop, which is dedicated to the chip reliability issues on Oct. 15, 2014 in Austin, TX. The presentation is titled as follows:
13th International Workshop on Stress-Induced Phenomena in Microelectronics (Stress Workshop), The University of Texas at Austin, Austin, "Physics-Based Electromigration Assessment for Power Grid Networks", Oct. 15th, 2014.