Our collaborative paper with Prof. Haibao Chen at SJTU won the Excellent Student Paper Award: J. Peng, H. Chen, H. Zhao, Z. Sun and S. X.-D. Tan, “Dynamic temperature-aware reliability modeling for multi-branch interconnect trees”, in Proc. International Conference on ASIC (ASICON’17), Guiyang, China, Oct. 2017. Congratulation on Haibao, Hengyang and Zeyu are also co-authors.
Our recent works on EM survey has been published to Integration, the VLSI Journal: S. X.-D. Tan, H.Amrouch, T. Kim, Z.Sun, C.Cook, J.Henkel, "Recent Advances in EM and BTI induced Reliability Modeling, Analysis and Optimization", Integration, the VLSI Journal Congratulations Dr. Sheldon Tan and co-authors.
Our recent works on TDDB modeling for interconnect dielectrics has been accepted to IEEE Transactions on Very Large Scale Integreation Systems (TVLSI): S. Peng, H. Zhou, T. Kim, H. Chen, S. X.-D. Tan, "Physics-based Compact TDDB Models for Low-k BEOL Copper Interconnects with Time-Varying Voltage Stressing", IEEE Transactions on Very Large Scale Integreation Systems (TVLSI)...
Dr. Naehyuck Chang from the Korea Advanced Institute of Science and Technology (KAIST) visited VSCLAB at UC Riverside. He gave a talk titled titled "Design Automation of Cyberphysical Systems: System-Level Approaches for Energy-Aware Electric Vehicle Design and Management" for his recent works on EV and energy optimization for EVs.
Dr. Sheldon Tan was awarded Japan Society For the Promotion of Science (JSPS) International Fellowship. The JSPS fellowship will support the oversea researchers with excellent records of research achievements for short-term visits Japan and provide them opportunities for discussions, option exchanges, lectures and other activities. Dr. Tan will visit Prof. Takashi Sato at Kyoto University...
The Defense Advanced Research Projects Agency (DARPA), Microsystems Technology Office (MTO) continued the funding of the reliability research project at UCR for developing new physics-based compact electromigration (EM) reliability models and assessment techniques for VLSI interconnects. The project is part of the Integrity and Reliability of Integrated circuitS (IRIS) Program Phase III in DARPA. Dr...
Dr. Sheldon Tan has been re-apponted as the Editor-in-Chief (EiC) for Integration, The VLSI Journal for the coming 2018-2020 period. Dr. Tan has been the EiC for Integration, The VLSI Journal since 2016. The impact factor of Integration has increased from 0.703 in 2015 to 1.00 in 2016, which represents 42.4% improvement.
Two PhD students at VSCLab Zeyu Sun and Shaoyi Peng, who are directed by Prof. Sheldon Tan, joined 54rd Design Automation Conference (DAC) Work In Progress(WIP) session. Shaoyi Peng get supports from the award for his travel to attend upcoming 54rd DAC. This award is named to honor the memory of Dr. A. Richard Newton...
Dr. Ertugrul Demircan and Dr. Mehul Shroff received the 2017 SRC Mahboob Khan Outstanding Industry Liaison/Associate Awards with collaboration of VSCLab. This award recognizes those individuals who demonstrate outstanding commitment and effectiveness in facilitation of university research, mentoring of graduate students, and dissemination of knowledge and research results to industry.
Ph.D. student Taeyoung Kim passed his Ph.D. defenses today. Congratulation on his hard works and successful defenses. Taeyoung’s Ph.D. work focuses on the system-level dynamic reliability management. Taeyoung will join Intel Corporation as a full-time Senior R&D Engineer position after graduation.
One PhD students at VSCLab, which are directed by Prof. Sheldon Tan, has received the Richard Newton Young Student Fellow Award from 54rd Design Automation Conference (DAC), which is a prestigious award for junior Ph.D. students who studied in the electronic design automation (EDA) and embedded system design areas. A PhD student, Shaoyi Peng will...
Dr. David Pan from the University of Texas at Austin visited VSCLAB and we introduced our lab research work at UCR. He gave a talk titled "Bridging IC Design & Technology Gaps for Manufacturability, Reliability, and Security in Extreme Scaling" in the ECE department at UC Riverside.
Dr. Tan visited the Boeing Research & Technology, Boeing Company, Huntington Beach, CA, He also delivered a talk titled “Accelerated Electromigration Aging Analysis and EM-based On-Chip Aging Sensor for Detection and Prevention of Counterfeit and Recycled ICs”, His host is Dr. Mark Yao and he has some discussions with other research and engineers at Beoing...
Dr. Telli Faez, Publisher at Reed Elsevier at Paris, France, visited VSCLAB at UCR. Dr. Faez is an publisher of the journal: Integration, The VLSI Journal, where Professor Tan has been appointed as the Editor-In-Chief (EIC) since Jan 2016. Dr. Faez and Dr. Tan visited and discussed the management and publishing of the journal. She...
Prof. Esteban Tlelo-Cuautle from Instituto Nacional de Astrofísica, pticay Electrónica visited VSCLAB at UCR. Prof. Tlelo is an expert on design automation of analog integrated ciruits, analysis and synthesis of analog ICs, multi-objective optimization, and chaotic oscillation system. His visit is part of the UC-Mexus collaboration project. He also gave a talk titled "Applications of...
