Our recent works on EM survey has been published to Integration, the VLSI Journal:

• S. X.-D. Tan, H.Amrouch, T. Kim, Z.Sun, C.Cook, J.Henkel, "Recent Advances in EM and BTI induced Reliability Modeling, Analysis and Optimization", Integration, the VLSI Journal

Congratulations  Dr. Sheldon Tan and  co-authors.