Our recent works have been accepted into IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) as follows:

• X. Huang, A. Kteyan, S. X.-D. Tan, V. Sukharev, “Physics-based electromigration models and full-chip assessment for power grid networks”, IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (TCAD), (in press)

• H. Chen, S. X.-D. Tan, X. Huang, T. Kim, V. Sukharev, “Analytical modeling and characterization of electromigration effects for multi-branch interconnect trees”, IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems (TCAD), (in press)

Congratulation on Xin, Haibao and all the co-authors.