Prof. Tan gave an invited talk in the 4nd International Workshop on Cross-layer Resiliency (IWCR 2016) at University of California at Irvine. The tile of the talk is  “Voltage-based EM Immortality Check and new EM Signoff Flow”. In this talk, Prof. Tan proposed a new EM assessment and signoff flow for the future VLSI chip design as EM is becoming the major long-term reliability constraint and design concern.