Dr. Sheldon Tan presented our recent works on Electromigrstion accelration in the 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD). This paper has been nominated for Honorable mention Best Paper Award.  

S. Sadiqbatcha, C. Cook, Z. Sun and S. X. -. Tan, "Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires," 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD). (Honorable mention Best Paper Award) 

Congratulations Sheriff and co-authors.