Ph.D. student Subed Lamichhane successfully passed his PhD defense today. 

His thesis is titled "Advances in ML-driven design automation for VLSI reliability analysis". Suned made many significant contributions  to the VLSI reliability analysis. He also developped the EMspice 2.1 to consider the thermal impacts on the electromigration and IR drop analysis.

 Subed will join Analog Device as the CAD and reliability engineer in Raleihn, NC. Congratulations on Subed and we will him the best for his future endeavors.