Our recent works on fast EM analysis using Krylov subspace has been accepted to IEEE Transactions on Very Large Scale Integreation Systems (TVLSI) as follows: C.Cook, Z.Sun, E.Demircan, M. D. Shroff, , S. X.-D. Tan, "Fast Electromigration Stress Evolution Analysis for Interconnect Trees using Krylov Subspace Method" IEEE Transactions on Very Large Scale Integreation Systems...