Breadcrumb

Latest News for January 11th, 2018

Our recent works on fast EM analysis using Krylov subspace has been accepted to IEEE Transactions on Very Large Scale Integreation System

Our recent works on fast EM analysis using Krylov subspace has been accepted to IEEE Transactions on Very Large Scale Integreation Systems (TVLSI) as follows: C.Cook, Z.Sun, E.Demircan, M. D. Shroff, , S. X.-D. Tan, "Fast Electromigration Stress Evolution Analysis for Interconnect Trees using Krylov Subspace Method" IEEE Transactions on Very Large Scale Integreation Systems...