Our recent works on fast EM analysis using Krylov subspace has been accepted to IEEE Transactions on Very Large Scale Integreation System
Our recent works on fast EM analysis using Krylov subspace has been accepted to IEEE Transactions on Very Large Scale Integreation Systems (TVLSI) as follows:
- C.Cook, Z.Sun, E.Demircan, M. D. Shroff, , S. X.-D. Tan, "Fast Electromigration Stress Evolution Analysis for Interconnect Trees using Krylov Subspace Method" IEEE Transactions on Very Large Scale Integreation Systems (TVLSI), (in press)
Congratulations Chase and co-authors.